LB-572偏光照相顯微鏡
LB-572 無極平面光學系統 （無限彩色校正系統）的 偏光照相顯微鏡雙目透射和反射系統專為地質，礦產，冶金，大學教學實驗室等部門而設計。它們也用于化纖行業，半導體行業和制藥檢驗行業越來越多。LB-572偏光顯微鏡具有高度堅固的結構和光學設計，可提供長壽命和優質的圖像。顯微鏡可用于單極化，正交極化和圓錐觀察。數碼相機可與顯微鏡一起用于圖像分析。

LB-572偏光照相顯微鏡

LB-572 無極平面光學系統 （無限彩色校正系統）的 偏光照相顯微鏡雙目透射和反射系統專為地質，礦產，冶金，大學教學實驗室等部門而設計。它們也用于化纖行業，半導體行業和制藥檢驗行業越來越多。LB-572偏光顯微鏡具有高度堅固的結構和光學設計，可提供長壽命和優質的圖像。顯微鏡可用于單極化，正交極化和圓錐觀察。數碼相機可與顯微鏡一起用于圖像分析。配件如石膏滑塊，云母滑塊，石英楔和機械平臺都可用。 特征 的無限光學系統 廣泛應用于地質學，礦物學，化石燃料勘探 可以使用單極化，正交極化或圓錐觀察。   光學系統 無限光學系統 觀察頭 Seidentopf雙目觀察頭，傾斜30°，360°可旋轉 目鏡 WF10×/ 20，十字準線 WF10×/ 20帶刻度 WF10×/ 20 無限制無色平場消色差物鏡 反射/透射物鏡：4×，10× 傳輸物鏡：20×，40×，60× 旋轉盤 后退四重旋轉盤，中心可調 落射照明 12V / 50W鹵素燈，亮度可調; 可變孔徑光闌/場膜片 分析儀 旋轉分析儀，灰度為0°-360° 貝特朗鏡頭 Bertrand鏡頭，滑入/離開光路 光學補償器 λ滑移（一級紅色），1 /4λ滑移，石英楔 旋轉 圓形載物臺 直徑Φ160mm，刻度為1°，小分辨率6'，當使用游標刻度時 聚光器 NA 0.9阿貝冷凝器帶虹彩光闌和過濾器 調焦 同軸粗調 精度范圍24mm，細分0.002mm 偏光片 可旋轉360° 傳輸照明 12V / 30W鹵素燈，亮度可調 飾品 機械平臺移動范圍30x40mm  千分尺 色差校正濾鏡

LB-572偏光照相顯微鏡

 Features
• Excellent Infinite
Optical System
• Widely used in
Geology, Mineralogy,
Fossil fuel exploration
• Single polarization, orthogonal
polarization or conoscopic
observation is available.
ISO 9001-2008, CE
and FDA Certi?? ed
Manufacturer of Scienti?? c Instruments
LLABBOMEED IINNC..
Sample Images
e
alogy,
oration
on, onoscopic
vailable.

 LB-200
LB-572 Polarizing Photo Microscope Binocular Transmission and Re?? ection
System with In?? nite Plan Optical System (In?? nity Color Corrected System)
Applications
LB-572 Polarizing Photo Microscope Binocular Transmission and Reflection System with
Infinite Plan Optical System (Infinity Color Corrected System) are specifically designed
for geology, minerals, metallurgy, university teaching laboratories and other sectors. They
are also used in chemical fiber industry, semiconductor industry and the pharmaceutical
inspection industry more and more. The LB-572 polarizing microscope features a highly robust
construction and first class optics designed to provide a long life and excellent quality images.
The microscopes can be used for Single polarization, orthogonal polarization and conoscopic
observation. Digital camera can be used together with the microscope for image analysis.
Accessories like Gypsum slide, Mica slide, Quartz wedge and Mechanical stage are available.
Technical Speci?? cations
Optical System Infinite Optical System
Viewing Head Seidentopf Binocular Viewing Head, inclined at 30°, 360°
Rotatable
Eyepiece WF10×/ 20 with scale of Crosshair
WF10×/ 20 with Graticule
WF10×/ 20
Infi nite Strain Free Plan Reflected/transmitted objective: 4×, 10×
Achromatic Objective Reflected/transmitted objective: 4×, 10×
Transmitted objective: 20×, 40×, 60×
Nosepiece Backward quadruple nosepiece, center adjustable
Epi-Illumination 12V/50W halogen lamp, brightness adjustable; variable aperture
diaphragm / field diaphragm
Analyzer Rotatable analyzer with gradation 0°-360°
Bertrand Lens Bertrand lens, sliding in/out of optical path
Optical Compensator ?? Slip (first class red), 1/ 4?? Slip, Quartz wedge
Revolving Round Stage Diameter ??160mm, Graduated in 1° increments, Minimum
resolution 6’ when using vernier scale
Condenser NA 0.9 Abbe Condenser with Iris Diaphragm & Filter
Focusing Coaxial Coarse & Fine Adjustment, Range 24mm,
Fine Division 0.002mm
Polarizer 360°Rotatable
Transmitted Illumination 12V/ 30W Halogen Lamp, Brightness Adjustable
Accessories Mechanical stage moving rang 30x40mm, Micrometer
Color correction filter